Semiconductor test apparatus

1. Field of the Invention In the present invention, measuring the one-dimensional or two-dimensional voltage distribution or electrical field distribution in a measured device is made possible, and a reduction in the measuring time can be implemented. The present invention comprises a first optical system () wherein light emitted from the light source is shaped into a line-shaped light beam and irradiates a desired measurement line in the measured device via the electrooptic element, a second optical system () that maintains as-is the shape of the line-shaped light beam reflected from the desired measurement line in the measured device after transiting the electro-optic element, a light receiving device () that receives the line-shaped light beam emitted from the second optical system and converts each of the measured points to an electrical signal depending on the strength of each light beam reflected at each of the measured points on the desired measurement line on the measured device and outputs the result, and a signal processing device () that calculates the voltage or electrical field at each of the measured points of the measured device from the output signal of the light receiving device and calculates the electrical field distribution or the voltage distribution at the measured part of measured device.