Thin layer nuclear density gauge

The present invention relates to an apparatus and method for determining the density of materials and, more particularly, relates to an apparatus and method for measuring the density of thin layers of materials. The present invention provides an improved thin layer nuclear density gauge comprising a gauge housing having a vertical cavity therethrough and a base, a first radiation detector located at a first position within said housing and adjacent to said base of said housing, a second radiation detector located at a second position within said housing and adjacent to said base of said housing, a vertically moveable source rod extending into said cavity of said gauge housing, a radiation source operatively positioned within a distal end of said source rod, at least one bearing operatively positioned to guide said source rod within said cavity, and means for vertically extending and retracting said source rod to a plurality of predetermined source rod positions so as to change the spatial relationship between said radiation source and said first and second radiation detectors. The source rod has a maximum radial movement of less than about 0.003 inch at each predetermined position. The present invention also provides a gauge with an improved radiation shield assembly comprising a sliding block operatively positioned to move laterally between said first position and said second position, a spring engaging said sliding block and biasing said sliding block into said first position, and a fixed block, said fixed block including a track engaging said sliding block and guiding movement of said sliding block.