Method and apparatus for identifying composite defective pixel map

An apparatus for use with a detector system including a solid state flat panel detector and an image processor, the detector including a plurality of pixels, each pixel generating an initial intensity signal, the initial signals together defining an initial image, the processor storing an initial ba...

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Bibliographische Detailangaben
Hauptverfasser: Odogba, Jibril, Kump, Ken, Xue, Ping, Langler, Donald, French, John, Boudry, John
Format: Patent
Sprache:eng
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Zusammenfassung:An apparatus for use with a detector system including a solid state flat panel detector and an image processor, the detector including a plurality of pixels, each pixel generating an initial intensity signal, the initial signals together defining an initial image, the processor storing an initial bad pixel map that includes a known bad pixel set, after signals are generated, the processor automatically using intensity signals corresponding to other than the bad pixel set to generate replacement intensity signals for each of the bad pixel set pixels thereby generating a corrected image, the apparatus for identifying additional bad pixels, the apparatus comprising a processor that, after the image data is collected, examines at least one of the initial image and the corrected image to identify a likely additional bad pixel set including pixels that have unexpected values and an interface for indicating the likely bad set to a system user.