Flaw detection in objects and surfaces
The invention relates generally to the simultaneous acquisition of superimposed color dark-field and light-field images with a camera followed by decoupling of the images into monochrome components for further analysis of surface defects.
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | The invention relates generally to the simultaneous acquisition of superimposed color dark-field and light-field images with a camera followed by decoupling of the images into monochrome components for further analysis of surface defects. |
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