Semiconductor device, semiconductor test structure and method for fabricating a semiconductor device

An insulation region comprising a dielectric is applied to an electrically active region, and then an electrically conductive region which is connected to an electrically conductive supply conductor is applied to the insulation region. An auxiliary conductor track, which is connected to a region whi...

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Bibliographische Detailangaben
Hauptverfasser: Fazekas, Josef, Martin, Andreas
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:An insulation region comprising a dielectric is applied to an electrically active region, and then an electrically conductive region which is connected to an electrically conductive supply conductor is applied to the insulation region. An auxiliary conductor track, which is connected to a region which is highly doped at least with doping atoms of a first conductivity type, is arranged adjacent to the electrically conductive supply conductor.