Ion monitoring

The apparatus and method provide a technique for significantly reducing capacitance effects in detector electrodes arising due to movement of the instrument relative to the item/location being monitored in ion detection based techniques. The capacitance variations are rendered less significant by pl...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Orr, Christopher, Luff, Craig, Dockray, Thomas, Macarthur, Duncan
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The apparatus and method provide a technique for significantly reducing capacitance effects in detector electrodes arising due to movement of the instrument relative to the item/location being monitored in ion detection based techniques. The capacitance variations are rendered less significant by placing an electrically conducting element between the detector electrodes and the monitored location/item. Improved sensitivity and reduced noise signals arise as a result. The technique also provides apparatus and method suitable for monitoring elongate items which are unsuited to complete enclosure in one go within a chamber. The items are monitored part by part as the pass through the instrument, so increasing the range of items or locations which can be successfully monitored.