PROBE DEVICE WITH SPIRAL SPRING, ROTATING HEAD AND TESTING APPARATUS

A probe device for a rotating head has at least one support arm that is mounted so as to rotate around an axis of rotation, at least one probe that is joined to the support arm, and at least one spring element that can be supported on the rotating head and engages at the support arm and that is provided for exerting a force on the support arm, which, as a result of this force, experiences a torque with respect to the axis of rotation. The support arm has at least one mount, which is concentric with the axis of rotation, for the spring element, which, when arranged on the mount, is bent at least in part around the axis of rotation. As a consequence, centrifugal forces that act on the spring element when the rotating head is in operation have no influence on the tension of the spring element.