High-voltage single-crystal diamond diodes

Demonstration of a 2.5-kV diamond diode is provided by electrical measurements using a circular gold Schottky contact, with an area >1 mm/sup 2/, on large area freestanding single-crystal diamond consisting of a thin high purity layer (1/spl times/0/sup 19/ [B]/cm/sup 3/) substrate with an ohmic...

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Veröffentlicht in:IEEE transactions on electron devices 2004-05, Vol.51 (5), p.826-828
Hauptverfasser: Twitchen, D.J., Whitehead, A.J., Coe, S.E., Isberg, J., Hammersberg, J., Wikstrom, T., Johansson, E.
Format: Artikel
Sprache:eng
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Zusammenfassung:Demonstration of a 2.5-kV diamond diode is provided by electrical measurements using a circular gold Schottky contact, with an area >1 mm/sup 2/, on large area freestanding single-crystal diamond consisting of a thin high purity layer (1/spl times/0/sup 19/ [B]/cm/sup 3/) substrate with an ohmic back contact. The diode structures were fabricated using a microwave-assisted chemical vapor deposition process. The forward properties of the diode show a space charge limited current, with a forward-voltage drop of 2 V and a hole mobility of 4100/spl plusmn/400 cm/sup 2//Vs at room temperature. For temperatures between 300 K
ISSN:0018-9383
1557-9646
1557-9646
DOI:10.1109/TED.2004.826867