An electron energy loss spectrometer based streak camera for time resolved TEM measurements

We propose an experimental setup based on a streak camera approach inside an energy filter to measure time resolved properties of materials in the transmission electron microscope (TEM). In order to put in place the streak camera, a beam sweeper was built inside an energy filter. After exciting the TEM sample, the beam is swept across the CCD camera of the filter. We describe different parts of the setup at the example of a magnetic measurement. This setup is capable to acquire time resolved diffraction patterns, electron energy loss spectra (EELS) and images with total streaking times in the range between 100ns and 10μs. •A streak camera based time-resolved setup for TEM is proposed.•The streak camera is built in the energy filter to sweep the beam on the detector.•The setup can acquire 1-dimensional time-resolved diffractions patterns and images.•Time resolved Lorentz force microscopy as well as EELS signals can be acquired.•The time resolution is in μs to ns range with large improvements in time resolution possible.