A method for measuring exchange stiffness in ferromagnetic films

A method for measuring exchange stiffness in ferromagnetic films

An exchange stiffness, A ex , in ferromagnetic films is obtained by fitting the M ( H ) dependence of two ferromagnetic layers antiferromagnetically coupled across a nonmagnetic spacer layer with a simple micromagnetic model. In epitaxial and textured structures this method allows measuring A ex bet...

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Veröffentlicht in:Journal of applied physics 2011-04, Vol.109 (7), p.07B765-07B765-3
Hauptverfasser: Girt, Erol, Huttema, W., Mryasov, O. N., Montoya, E., Kardasz, B., Eyrich, C., Heinrich, B., Dobin, A. Yu, Karis, O.
Format: Artikel
Sprache:eng
Schlagworte:
COBALT
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
CRYSTAL GROWTH METHODS
CRYSTALLOGRAPHY
ELECTRONS
ELEMENTARY PARTICLES
ELEMENTS
EPITAXY
EXCHANGE INTERACTIONS
FERMIONS
FERROMAGNETIC MATERIALS
FLEXIBILITY
INTERACTIONS
LAYERS
LEPTONS
MAGNETIC MATERIALS
MATERIALS
MECHANICAL PROPERTIES
METALS
NATURAL SCIENCES
NATURVETENSKAP
TENSILE PROPERTIES
THIN FILMS
TRANSITION ELEMENTS
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Beschreibung
Zusammenfassung:An exchange stiffness, A ex , in ferromagnetic films is obtained by fitting the M ( H ) dependence of two ferromagnetic layers antiferromagnetically coupled across a nonmagnetic spacer layer with a simple micromagnetic model. In epitaxial and textured structures this method allows measuring A ex between the crystallographic planes perpendicular to the growth direction of ferromagnetic films. Our results show that A ex between [0001] planes in textured Co grains is 1.54±0.12×10 −11 J/m.
ISSN:0021-8979
1089-7550
1089-7550
DOI:10.1063/1.3565203