On the Charge Collection Efficiency of the PERCIVAL Detector

The PERCIVAL soft X-ray imager is being developed by DESY, RAL, Elettra, DLS, and PAL to address the challenges at high brilliance Light Sources such as new-generation Synchrotrons and Free Electron Lasers. Typical requirements for detector systems at these sources are high frame rates, large dynami...

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Veröffentlicht in:Journal of instrumentation 2016-12, Vol.11 (12), p.C12032-C12032, Article C12032
Hauptverfasser: Correa, J., Marras, A., Wunderer, C.B., Göttlicher, P., Lange, S., Reza, S., Shevyakov, I., Tennert, M., Niemann, M., Hirsemann, H., Smoljanin, S., Supra, J., Xia, Q., Zimmer, M., Allahgholi, A., Gloskovskii, A., Viefhaus, J., Scholz, F., Seltmann, J., Klumpp, S., Cautero, G., Giuressi, D., Khromova, A., Menk, R., Pinaroli, G., Stebel, L., Rinaldi, S., Zema, N., Catone, D., Pedersen, U., Tartoni, N., Guerrini, N., Marsh, B., Sedgwick, I., Nicholls, T., Turchetta, R., Hyun, H.J., Kim, K.S., Rah, S.Y., Hoenk, M.E., Jewell, A.D., Jones, T.J., Nikzad, S., Graafsma, H.
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Sprache:eng
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Zusammenfassung:The PERCIVAL soft X-ray imager is being developed by DESY, RAL, Elettra, DLS, and PAL to address the challenges at high brilliance Light Sources such as new-generation Synchrotrons and Free Electron Lasers. Typical requirements for detector systems at these sources are high frame rates, large dynamic range, single-photon counting capability with low probability of false positives, high quantum efficiency, and (multi)-mega-pixel arrangements. PERCIVAL is a monolithic active pixel sensor, based on CMOS technology. It is designed for the soft X-ray regime and, therefore, it is post-processed in order to achieve high quantum efficiency in its primary energy range (250 eV to 1 keV) . This work will report on the latest experimental results on charge collection efficiency obtained for multiple back-side-illuminated test sensors during two campaigns, at the P04 beam-line at PETRA III, and the CiPo beam-line at Elettra, spanning most of the primary energy range as well as testing the performance for photon-energies below 250 eV . In addition, XPS surface analysis was used to cross-check the obtained results.
ISSN:1748-0221
1748-0221
DOI:10.1088/1748-0221/11/12/C12032