Electrical and luminescent properties and the spectra of deep centers in GaMnN/InGaN light-emitting diodes

Electrical and electroluminescent properties were studied for GaN/InGaN light-emitting diodes (LEDs) with the n-GaN layer up and with the top portion of the n layer made of undoped GaMnN to allow polarization modulation by applying an external magnetic field (so-called "spin-LEDs"). The co...

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Veröffentlicht in:Journal of electronic materials 2004-03, Vol.33 (3), p.241-247
Hauptverfasser: Polyakov, A. Y., Smirnov, N. B., Govorkov, A. V., Kim, Jihyun, Ren, F., Thaler, G. T., Frazier, R. M., Gila, B. P., Abernathy, C. R., Pearton, S. J., Buyanova, I. A., Rudko, G. Y., Chen, W. M., Pan, C. -C., Chen, G. -T., Chyi, J. -I., Zavada, J. M.
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Sprache:eng
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Zusammenfassung:Electrical and electroluminescent properties were studied for GaN/InGaN light-emitting diodes (LEDs) with the n-GaN layer up and with the top portion of the n layer made of undoped GaMnN to allow polarization modulation by applying an external magnetic field (so-called "spin-LEDs"). The contact annealing temperature was kept to 750 deg C, which is the thermal stability limit for retaining room-temperature magnetic ordering in the GaMnN layer. Measurable electroluminescence (EL) was obtained in these structures at threshold voltages of ~15 V, with a lower EL signal compared to control LEDs without Mn. This is related to the existence of two parasitic junctions between the metal and the lower contact p-type layer and between the GaMnN and the n-GaN in the top contact layer.
ISSN:0361-5235
1543-186X
1543-186X
DOI:10.1007/s11664-004-0186-7