Estimating Depolarization with the Jones Matrix Quality Factor

[Display omitted] •New factor, called Jones Matrix Quality Factor, QJM, is introduced to provide a figure of merit to estimate depolarization from any sample or optic.•QJM can be calculated even from an incomplete MM, such as measured with PCSA or PSCA instrument.•QJM is successfully demonstrated for:. Isotropic non-uniform film: depolarization from thickness non-uniformity. Anisotropic sapphire substrate in transmission and reflection: depolarization from multiple incoherent beams through substrate and finite bandwidth. Diattenuating beetle cuticle: depolarization from smeared “twist” Mueller matrix (MM) measurements offer the ability to quantify the depolarization capability of a sample. Depolarization can be estimated using terms such as the depolarization index or the average degree of polarization. However, these calculations require measurement of the complete MM. We propose an alternate depolarization metric, termed the Jones matrix quality factor, QJM, which does not require the complete MM. This metric provides a measure of how close, in a least-squares sense, a Jones matrix can be found to the measured Mueller matrix. We demonstrate and compare the use of QJM to other traditional calculations of depolarization for both isotropic and anisotropic depolarizing samples; including non-uniform coatings, anisotropic crystal substrates, and beetle cuticles that exhibit both depolarization and circular diattenuation.