Dynamic avalanche and reliability of high voltage diodes
Diode failures are a limiting factor for the reliability of power circuits. One failure reason is dynamic avalanche. Dynamic avalanche can be distinguished in three degrees, and some designs are rugged up to the third degree. Design modifications for improving the dynamic ruggedness and suitable tes...
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| Veröffentlicht in: | Microelectronics and reliability 2003-04, Vol.43 (4), p.529-536 |
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| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | eng |
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| Online-Zugang: | Volltext |
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| Zusammenfassung: | Diode failures are a limiting factor for the reliability of power circuits. One failure reason is dynamic avalanche. Dynamic avalanche can be distinguished in three degrees, and some designs are rugged up to the third degree. Design modifications for improving the dynamic ruggedness and suitable test conditions are proposed. |
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| ISSN: | 0026-2714 1872-941X 1872-941X |
| DOI: | 10.1016/S0026-2714(03)00020-9 |