Molecular beam epitaxy of III-PxAs1 − x solid solutions: Mechanism of composition formation in the sublattice of a group V element
The effect of substrate temperature, As 2 and P 2 molecular flux densities, and growth rate on the composition of III-P x As 1 − x solid solution layers prepared by molecular beam epitaxy is experimentally investigated. Experimental data in a wide range of growth conditions are analyzed. The results...
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Veröffentlicht in: | Semiconductors (Woodbury, N.Y.) N.Y.), 2015, Vol.49 (2), p.157-165 |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | The effect of substrate temperature, As
2
and P
2
molecular flux densities, and growth rate on the composition of III-P
x
As
1 −
x
solid solution layers prepared by molecular beam epitaxy is experimentally investigated. Experimental data in a wide range of growth conditions are analyzed. The results obtained are presented in the form of a kinetic model for describing the process of formation of the composition in the Group V sublattice of the III-P
x
As
1 −
x
solid solution upon molecular beam epitaxy. The model can be used for choosing the growth conditions of the III-P
x
As
1 −
x
(001) solid-solution layers of a specified composition. |
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ISSN: | 1063-7826 1090-6479 |
DOI: | 10.1134/S1063782615020062 |