Phase formation upon the interaction of thin films in the system Yb1 − xSmxTe-As2Te3
Phase formation upon the interaction of thin Yb 1 − x Sm x Te ( x = 0.02) and As 2 Te 3 films obtained through their simultaneous and successive evaporation is studied. It is shown that the Yb 1 − x Sm x As 4 Te 7 phase is formed upon interaction of the thin films at a temperature of 473 K and the Y...
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Veröffentlicht in: | Semiconductors (Woodbury, N.Y.) N.Y.), 2014, Vol.48 (11), p.1525-1526 |
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Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | Phase formation upon the interaction of thin Yb
1 −
x
Sm
x
Te (
x
= 0.02) and As
2
Te
3
films obtained through their simultaneous and successive evaporation is studied. It is shown that the Yb
1 −
x
Sm
x
As
4
Te
7
phase is formed upon interaction of the thin films at a temperature of 473 K and the Yb
1−
x
Sm
x
As
2
Te
4
phase at 503 K. |
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ISSN: | 1063-7826 1090-6479 |
DOI: | 10.1134/S1063782614110116 |