Growth and structure of epitaxial Pb1 − xMnxSe(Ga) films
The growth and structure of Pb 1 − x Mn x Se (Ga) (N Ga = 0.8 at %) films with thicknesses of 0.3–0.5 μm, grown on single-crystal PbSe 1 − x S x (100) substrates by molecular-beam epitaxy, have been studied. It is established that films grow in a face-centered cubic lattice with the (100) orientatio...
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Veröffentlicht in: | Crystallography reports 2009, Vol.54 (2), p.331-333 |
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creator | Nuriyev, I. R. Gadzhiyev, M. B. Sadigov, R. M. |
description | The growth and structure of Pb
1 −
x
Mn
x
Se (Ga) (N
Ga
= 0.8 at %) films with thicknesses of 0.3–0.5 μm, grown on single-crystal PbSe
1 −
x
S
x
(100) substrates by molecular-beam epitaxy, have been studied. It is established that films grow in a face-centered cubic lattice with the (100) orientation, reproducing the substrate orientation. The optimal conditions for obtaining photosensitive epitaxial films with perfect crystal structure are determined (
W
1/2
= 70–80″). |
doi_str_mv | 10.1134/S1063774509020254 |
format | Article |
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1 −
x
Mn
x
Se (Ga) (N
Ga
= 0.8 at %) films with thicknesses of 0.3–0.5 μm, grown on single-crystal PbSe
1 −
x
S
x
(100) substrates by molecular-beam epitaxy, have been studied. It is established that films grow in a face-centered cubic lattice with the (100) orientation, reproducing the substrate orientation. The optimal conditions for obtaining photosensitive epitaxial films with perfect crystal structure are determined (
W
1/2
= 70–80″).</description><identifier>ISSN: 1063-7745</identifier><identifier>EISSN: 1562-689X</identifier><identifier>DOI: 10.1134/S1063774509020254</identifier><language>eng</language><publisher>Dordrecht: SP MAIK Nauka/Interperiodica</publisher><subject>Crystallography and Scattering Methods ; Physics ; Physics and Astronomy ; Surface and Thin Films</subject><ispartof>Crystallography reports, 2009, Vol.54 (2), p.331-333</ispartof><rights>Pleiades Publishing, Ltd. 2009</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1134/S1063774509020254$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1134/S1063774509020254$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27903,27904,41467,42536,51298</link.rule.ids></links><search><creatorcontrib>Nuriyev, I. R.</creatorcontrib><creatorcontrib>Gadzhiyev, M. B.</creatorcontrib><creatorcontrib>Sadigov, R. M.</creatorcontrib><title>Growth and structure of epitaxial Pb1 − xMnxSe(Ga) films</title><title>Crystallography reports</title><addtitle>Crystallogr. Rep</addtitle><description>The growth and structure of Pb
1 −
x
Mn
x
Se (Ga) (N
Ga
= 0.8 at %) films with thicknesses of 0.3–0.5 μm, grown on single-crystal PbSe
1 −
x
S
x
(100) substrates by molecular-beam epitaxy, have been studied. It is established that films grow in a face-centered cubic lattice with the (100) orientation, reproducing the substrate orientation. The optimal conditions for obtaining photosensitive epitaxial films with perfect crystal structure are determined (
W
1/2
= 70–80″).</description><subject>Crystallography and Scattering Methods</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Surface and Thin Films</subject><issn>1063-7745</issn><issn>1562-689X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><sourceid/><recordid>eNpjYJA0NNAzNDQ20Q82NDAzNjc3MTWwNDAyMDI1YWLgNDQ1M9I1s7CMYAGygdK6IHkOBq7i4iwDAwMLC0MTTgYr96L88pIMhcS8FIXikqLS5JLSolSF_DSF1ILMksSKzMQchYAkQ4VHHZMUKnzzKoJTNdwTNRXSMnNyi3kYWNMSc4pTeaE0N4ORm2uIs4ducUFRZl56alF8Vn5pUR5QKt7QIB7kyngMVxqTpQkAR1FD9w</recordid><startdate>2009</startdate><enddate>2009</enddate><creator>Nuriyev, I. R.</creator><creator>Gadzhiyev, M. B.</creator><creator>Sadigov, R. M.</creator><general>SP MAIK Nauka/Interperiodica</general><scope/></search><sort><creationdate>2009</creationdate><title>Growth and structure of epitaxial Pb1 − xMnxSe(Ga) films</title><author>Nuriyev, I. R. ; Gadzhiyev, M. B. ; Sadigov, R. M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-springer_journals_10_1134_S10637745090202543</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Crystallography and Scattering Methods</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Surface and Thin Films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Nuriyev, I. R.</creatorcontrib><creatorcontrib>Gadzhiyev, M. B.</creatorcontrib><creatorcontrib>Sadigov, R. M.</creatorcontrib><jtitle>Crystallography reports</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Nuriyev, I. R.</au><au>Gadzhiyev, M. B.</au><au>Sadigov, R. M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Growth and structure of epitaxial Pb1 − xMnxSe(Ga) films</atitle><jtitle>Crystallography reports</jtitle><stitle>Crystallogr. Rep</stitle><date>2009</date><risdate>2009</risdate><volume>54</volume><issue>2</issue><spage>331</spage><epage>333</epage><pages>331-333</pages><issn>1063-7745</issn><eissn>1562-689X</eissn><abstract>The growth and structure of Pb
1 −
x
Mn
x
Se (Ga) (N
Ga
= 0.8 at %) films with thicknesses of 0.3–0.5 μm, grown on single-crystal PbSe
1 −
x
S
x
(100) substrates by molecular-beam epitaxy, have been studied. It is established that films grow in a face-centered cubic lattice with the (100) orientation, reproducing the substrate orientation. The optimal conditions for obtaining photosensitive epitaxial films with perfect crystal structure are determined (
W
1/2
= 70–80″).</abstract><cop>Dordrecht</cop><pub>SP MAIK Nauka/Interperiodica</pub><doi>10.1134/S1063774509020254</doi></addata></record> |
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ispartof | Crystallography reports, 2009, Vol.54 (2), p.331-333 |
issn | 1063-7745 1562-689X |
language | eng |
recordid | cdi_springer_journals_10_1134_S1063774509020254 |
source | Springer Nature - Complete Springer Journals |
subjects | Crystallography and Scattering Methods Physics Physics and Astronomy Surface and Thin Films |
title | Growth and structure of epitaxial Pb1 − xMnxSe(Ga) films |
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