Studying the elemental composition and manganese distribution in Zn1 − xMnxTe and Zn1 − xMnxS films using the μ-PIXE and EDAX methods

The methods of proton-induced X-ray emission (μ-PIXE) and energy-dispersive X-ray analysis (EDAX) are used to study the elemental composition and areal distribution of manganese in Zn 1 − x Mn x Te and Zn 1 − x Mn x S films. The μ-PIXE technique is implemented using a nuclear scanning microprobe wit...

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Veröffentlicht in:	Surface investigation, x-ray, synchrotron and neutron techniques x-ray, synchrotron and neutron techniques, 2014, Vol.8 (2), p.259-262
Hauptverfasser:	Kurbatov, D. I., Klymov, A. V., Opanasyuk, A. S., Ponomarev, O. G., Mel’nik, S. S.
Format:	Artikel
Sprache:	eng
Schlagworte:	Chemistry and Materials Science Materials Science Surfaces and Interfaces Thin Films
Online-Zugang:	Volltext
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Zusammenfassung:	The methods of proton-induced X-ray emission (μ-PIXE) and energy-dispersive X-ray analysis (EDAX) are used to study the elemental composition and areal distribution of manganese in Zn 1 − x Mn x Te and Zn 1 − x Mn x S films. The μ-PIXE technique is implemented using a nuclear scanning microprobe with a proton-beam energy of 1.5 MeV and cross-sectional dimensions of 4 × 4 μm. The semimagnetic solid solution films are obtained under different operating modes of thermal vapor deposition in the quasiclosed volume of a manganese-containing blend.
ISSN:	1027-4510 1819-7094
DOI:	10.1134/S1027451014020177