Software package for reflection high energy electron diffraction beam intensity measurement and analysis system

Software package for reflection high energy electron diffraction beam intensity measurement and analysis system

The three packages of software for reflection high energy electron diffraction are described. There are one window, four windows and line-like options for different applications in molecular beam epitaxial growth processes, surface phenomena and diffraction features investigations.

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Bibliographische Detailangaben
Hauptverfasser: Cirlin, G. E., Guryanov, G. M., Korneeva, N. P., Samsonenko, Yu. B.
Format: Buchkapitel
Sprache:eng
Schlagworte:
Arbitrary Place
Molecular Beam Epitaxy
Molecular Beam Epitaxy Growth
Reflection High Energy Electron Diffraction
Surface Phenomenon
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Beschreibung
Zusammenfassung:The three packages of software for reflection high energy electron diffraction are described. There are one window, four windows and line-like options for different applications in molecular beam epitaxial growth processes, surface phenomena and diffraction features investigations.
ISSN:0302-9743
1611-3349
DOI:10.1007/BFb0020402