Noise reduction and peak detection in x-ray diffraction data by linear and nonlinear methods

Considerable progress has been made in the last few years in removing white noise from visible–near-ultraviolet (UV/VIS) spectra while leaving information intact. For x-ray diffraction, the challenges are different: detecting and locating peaks rather than line shape analysis. Here, we investigate p...

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Veröffentlicht in:Journal of vacuum science and technology. B, Nanotechnology & microelectronics Nanotechnology & microelectronics, 2023-07, Vol.41 (4)
Hauptverfasser: Le, Long V., Deijkers, Jeroen A., Kim, Young D., Wadley, Haydn N. G., Aspnes, David E.
Format: Artikel
Sprache:eng
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Zusammenfassung:Considerable progress has been made in the last few years in removing white noise from visible–near-ultraviolet (UV/VIS) spectra while leaving information intact. For x-ray diffraction, the challenges are different: detecting and locating peaks rather than line shape analysis. Here, we investigate possibilities of state-of-the-art UV/VIS methods for noise reduction, peak detection, and peak location applied to x-ray diffraction data, in this case, data for a ZrO2 −33 mol. % TaO4 ceramic. The same advantages seen in UV/VIS spectroscopy are found here as well.
ISSN:2166-2746
2166-2754
DOI:10.1116/6.0002526