Simulation-aided design of very-high-frequency excited nitrogen plasma confinement using a shield plate

Nitrogen atoms are versatile for nitridation applications and do not lead to plasma-induced damage. Large-sized wafer processing demands a uniform supply of nitrogen atoms produced in a high-density very-high-frequency excited plasma of N2 without ammonia. The confinement of plasma through the use o...

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Veröffentlicht in:Journal of vacuum science and technology. B, Nanotechnology & microelectronics Nanotechnology & microelectronics, 2019-11, Vol.37 (6)
Hauptverfasser: Isobe, Yasuhiro, Sakai, Takayuki, Suguro, Kyoichi, Miyashita, Naoto, Kondo, Hiroki, Ishikawa, Kenji, Wilson, Amalraj Frank, Shimizu, Naohiro, Oda, Osamu, Sekine, Makoto, Hori, Masaru
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Sprache:eng
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Zusammenfassung:Nitrogen atoms are versatile for nitridation applications and do not lead to plasma-induced damage. Large-sized wafer processing demands a uniform supply of nitrogen atoms produced in a high-density very-high-frequency excited plasma of N2 without ammonia. The confinement of plasma through the use of a plasma shield plate (PSP) allows the samples to be separated in a downstream chamber. Generation and transport of N atoms were computationally simulated, and the PSP designs were implemented by PSP parameterization. The supply of high-density N radicals to the sample stage was optimally designed with sufficiently small holes and thin PSP to satisfy an aspect ratio of thickness-to-hole-diameter of less than 2.5.
ISSN:2166-2746
2166-2754
DOI:10.1116/1.5114831