Local current–voltage estimation and characteristization based on field emission image processing of large-area field emitters

Local emission characteristics of microscopic emission sites on the surface of large-area field emitters are among the most important factors influencing macroscopic emission properties. This work aimed to evaluate the local field emission characteristics using a computerized field emission projecto...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of vacuum science and technology. B, Nanotechnology & microelectronics Nanotechnology & microelectronics, 2018-03, Vol.36 (2)
Hauptverfasser: Popov, Eugeni O., Kolosko, Anatoly G., Filippov, Sergey V., Terukov, Evgeny I.
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Local emission characteristics of microscopic emission sites on the surface of large-area field emitters are among the most important factors influencing macroscopic emission properties. This work aimed to evaluate the local field emission characteristics using a computerized field emission projector and a technique involving multichannel recording of current–voltage characteristics. The model field emitter consisted of nanocomposite multiwall carbon nanotubes in a polymer matrix.
ISSN:2166-2746
2166-2754
DOI:10.1116/1.5007006