Improved inflection point method of emissive probe for accurate measurement of plasma potential
The potential of the inflection point of emissive probe characteristics ( V i p ) in the limit of zero emission is considered to be an accurate indication of the plasma potential. Previous method for this limit is linearly extrapolating the change of V i p with respect to the electron emission curre...
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Veröffentlicht in: | Journal of vacuum science & technology. A, Vacuum, surfaces, and films Vacuum, surfaces, and films, 2016-11, Vol.34 (6) |
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Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | The potential of the inflection point of emissive probe characteristics (
V
i
p
) in the limit of zero emission is considered to be an accurate indication of the plasma potential. Previous method for this limit is linearly extrapolating the change of
V
i
p
with respect to the electron emission current
I
e
m
i
s
to the limit
I
e
m
i
s
≈
0
, which may result in inaccurate results since evidences showed that
V
i
p
does not change well linearly with
I
e
m
i
s
. The authors found in this study that, instead of
I
e
m
i
s
,
V
i
p
changes linearly with the probe heating current (
I
h
t
) which is a function of the probe temperature (
T
p
), and the phenomenon is reasonably interpreted by the space charge voltage increasing linearly with
T
p
. An improved inflection point method of emissive probe, which utilizes linear extrapolating the
V
i
p
−
I
h
t
relation to the heating current for initial emission, is proposed for accurate measurement of plasma potential. |
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ISSN: | 0734-2101 1520-8559 |
DOI: | 10.1116/1.4964834 |