In situ near-edge x-ray absorption fine structure spectroscopy investigation of the thermal defunctionalization of graphene oxide

In situ near-edge x-ray absorption fine structure (NEXAFS) spectroscopy is used in conjunction with measurements of sheet resistance to examine the electronic structure recovery of graphene oxide upon thermal annealing. Several different defunctionalization regimes are identified with the initial re...

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Veröffentlicht in:	Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 2012-11, Vol.30 (6)
Hauptverfasser:	Lee, Vincent, Dennis, Robert V., Jaye, Cherno, Wang, Xi, Fischer, Daniel A., Cartwright, Alexander N., Banerjee, Sarbajit
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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