Etching mechanisms of thin SiO2 exposed to Cl2 plasma
Plasma etching is the most standard patterning technology used in micro- and nano-technologies. Chlorine-based plasmas are often used for silicon etching. However, the behavior of thin silicon oxide exposed to such a plasma is still not fully understood. In this paper, we investigate how a thin sili...
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Veröffentlicht in: | Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena Microelectronics and nanometer structures processing, measurement and phenomena, 2011-09, Vol.29 (5) |
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Hauptverfasser: | , , , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | Plasma etching is the most standard patterning technology used in micro- and nano-technologies. Chlorine-based plasmas are often used for silicon etching. However, the behavior of thin silicon oxide exposed to such a plasma is still not fully understood. In this paper, we investigate how a thin silicon oxide layer on silicon behaves when it is exposed to a Cl2 plasma. The authors show that chlorine atoms diffuse and/or Cl+ ions are implanted through the thin ( |
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ISSN: | 1071-1023 2166-2746 1520-8567 2166-2754 |
DOI: | 10.1116/1.3622311 |