Etching mechanisms of thin SiO2 exposed to Cl2 plasma

Plasma etching is the most standard patterning technology used in micro- and nano-technologies. Chlorine-based plasmas are often used for silicon etching. However, the behavior of thin silicon oxide exposed to such a plasma is still not fully understood. In this paper, we investigate how a thin sili...

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Veröffentlicht in:Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena Microelectronics and nanometer structures processing, measurement and phenomena, 2011-09, Vol.29 (5)
Hauptverfasser: Petit-Etienne, C., Darnon, M., Vallier, L., Pargon, E., Cunge, G., Fouchier, M., Bodart, P., Haass, M., Brihoum, M., Joubert, O., Banna, S., Lill, T.
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Sprache:eng
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Zusammenfassung:Plasma etching is the most standard patterning technology used in micro- and nano-technologies. Chlorine-based plasmas are often used for silicon etching. However, the behavior of thin silicon oxide exposed to such a plasma is still not fully understood. In this paper, we investigate how a thin silicon oxide layer on silicon behaves when it is exposed to a Cl2 plasma. The authors show that chlorine atoms diffuse and/or Cl+ ions are implanted through the thin (
ISSN:1071-1023
2166-2746
1520-8567
2166-2754
DOI:10.1116/1.3622311