Fabrication of active-matrix high-efficiency electron emission deviceand its application to high-sensitivity image sensing

Practical advantages of an advanced high-efficiency electron emission device (HEED) (low-voltage operation, relatively simple structure, and availability for large-area applications) are further confirmed by its compatibility with active-matrix drive configuration. The fabricated HEED array has been...

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Veröffentlicht in:Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena Microelectronics and nanometer structures processing, measurement and phenomena, 2006-03, Vol.24 (2), p.1021-1025
Hauptverfasser: Negishi, Nobuyasu, Tanaka, Ryota, Nakada, Tomonari, Sakemura, Kazuto, Okuda, Yoshiyuki, Satoh, Hideo, Watanabe, Atsushi, Yoshikawa, Takamasa, Ogasawara, Kiyohide, Nanba, Masakazu, Okazaki, Saburo, Tanioka, Kenkichi, Egami, Norifumi, Koshida, Nobuyoshi
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Zusammenfassung:Practical advantages of an advanced high-efficiency electron emission device (HEED) (low-voltage operation, relatively simple structure, and availability for large-area applications) are further confirmed by its compatibility with active-matrix drive configuration. The fabricated HEED array has been applied to a high-sensitivity image sensing tube with a target of high-gain avalanche rushing amorphous photoconductor (HARP). It is demonstrated that a prototype 256 × 192 pixel active-matrix HEED array operates well as an effective probe for high-resolution image pickup in combination with a HARP target. The advanced HEED array is promising for development of next-generation image sensor with ultrahigh sensitivity and high definition.
ISSN:1071-1023
1520-8567
DOI:10.1116/1.2165667