Three-dimensional distribution and propagation of dislocations in β-Ga2O3 revealed by Borrmann effect x-ray topography

Synchrotron radiation x-ray topography (XRT) in a transmission configuration based on the Borrmann effect (BE) was carried out to observe characteristic dislocation structures and three-dimensional distribution and propagation of dislocations in β-Ga2O3 grown via the edge-defined film-fed growth (EF...

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Veröffentlicht in:	Journal of applied physics 2023-10, Vol.134 (15)
Hauptverfasser:	Yao, Yongzhao, Tsusaka, Yoshiyuki, Hirano, Keiichi, Sasaki, Kohei, Kuramata, Akito, Sugawara, Yoshihiro, Ishikawa, Yukari
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics Burgers vector Crystal dislocations EFG (crystal growth) Gallium oxides Helices Substrates Synchrotron radiation Synchrotrons Threading dislocations Topography X ray topography
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