Correlation between crystallographic characteristics (according to the X-ray structural analysis data) and electrosurface mineral potentials

X-ray investigation methods are based on the studies of the diffraction patterns that are formed under the X-ray reflection by atomic planes in the crystal structure. The informational content of X-ray studies can be enlarged by taking into account contemporary concepts of the physical essence of electric charge and absolute electrosurface potential. Proceeding from the concepts of the real block-like (granular) submicrostructure of the crystals and their electrosurface properties an assumption was made that X-rays will penetrate though interfacial layers between the blocks along their edges making thus the crystal X-ray transparent. The interrelation of the crystallographic characteristics and the electrosurface potentials of minerals was investigated by the example of the compounds that are typical for mineral binders. The crystallographic characteristics of minerals were specified using the method of X-ray structural analysis. Electrosurface potentials were defined by the computational method. It was established that the electrosurface potential value is exposed to a substantial influence of the arrangement of oxygen atoms that are polarized and create an additional positive potential. A coefficient of the influence of the polarizability of the surface oxygen atoms on the electrosurface potential and double X-ray reflection angle was defined.