Diffraction enhanced imaging utilizing a laser produced x-ray source
Image formation by Fresnel diffraction utilizes both absorption and phase-contrast to measure electron density profiles. The low spatial and spectral coherence requirements allow the technique to be performed with a laser-produced x-ray source coupled with a narrow slit. This makes it an excellent c...
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Veröffentlicht in: | Review of scientific instruments 2022-09, Vol.93 (9), p.093502-093502 |
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Sprache: | eng |
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Zusammenfassung: | Image formation by Fresnel diffraction utilizes both absorption and phase-contrast to measure electron density profiles. The low spatial and spectral coherence requirements allow the technique to be performed with a laser-produced x-ray source coupled with a narrow slit. This makes it an excellent candidate for probing interfaces between materials at extreme conditions, which can only be generated at large-scale laser or pulsed power facilities. Here, we present the results from a proof-of-principle experiment demonstrating an effective ∼2 μm laser-generated source at the OMEGA Laser Facility. This was achieved using slits of 1 × 30 μm2 and 2 × 40 μm2 geometry, which were milled into 30 μm thick Ta plates. Combining these slits with a vanadium He-like 5.2 keV source created a 1D imaging system capable of micrometer-scale resolution. The principal obstacles to achieving an effective 1 μm source are the slit tilt and taper—where the use of a tapered slit is necessary to increase the alignment tolerance. We demonstrate an effective source size by imaging a 2 ± 0.2 μm radius tungsten wire. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/5.0091348 |