Diffraction enhanced imaging utilizing a laser produced x-ray source

Image formation by Fresnel diffraction utilizes both absorption and phase-contrast to measure electron density profiles. The low spatial and spectral coherence requirements allow the technique to be performed with a laser-produced x-ray source coupled with a narrow slit. This makes it an excellent c...

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Veröffentlicht in:Review of scientific instruments 2022-09, Vol.93 (9), p.093502-093502
Hauptverfasser: Oliver, M., Allen, C. H., Divol, L., Karmiol, Z., Landen, O. L., Ping, Y., Wallace, R., Schölmerich, M., Theobald, W., Döppner, T., White, T. G.
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Sprache:eng
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Zusammenfassung:Image formation by Fresnel diffraction utilizes both absorption and phase-contrast to measure electron density profiles. The low spatial and spectral coherence requirements allow the technique to be performed with a laser-produced x-ray source coupled with a narrow slit. This makes it an excellent candidate for probing interfaces between materials at extreme conditions, which can only be generated at large-scale laser or pulsed power facilities. Here, we present the results from a proof-of-principle experiment demonstrating an effective ∼2 μm laser-generated source at the OMEGA Laser Facility. This was achieved using slits of 1 × 30 μm2 and 2 × 40 μm2 geometry, which were milled into 30 μm thick Ta plates. Combining these slits with a vanadium He-like 5.2 keV source created a 1D imaging system capable of micrometer-scale resolution. The principal obstacles to achieving an effective 1 μm source are the slit tilt and taper—where the use of a tapered slit is necessary to increase the alignment tolerance. We demonstrate an effective source size by imaging a 2 ± 0.2 μm radius tungsten wire.
ISSN:0034-6748
1089-7623
DOI:10.1063/5.0091348