Charge-separated spectra of suprathermal highly charged bismuth ions in a dual laser-produced plasma soft x-ray source

We investigated the charge-separated spectra of highly charged suprathermal bismuth (Bi) ions from a dual laser-produced plasma soft x-ray source developed for soft x-ray microscopy. The charge distribution of these suprathermal ions emitted from a solid planar Bi target was measured by an electrost...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Review of scientific instruments 2020-08, Vol.91 (8), p.086103-086103
Hauptverfasser:	Kawasaki, Hiromu, Tamura, Toshiki, Sunahara, Atsushi, Nishikino, Masaharu, Namba, Shinichi, O’Sullivan, Gerry, Higashiguchi, Takeshi
Format:	Artikel
Sprache:	eng
Schlagworte:	Bismuth Charge distribution Scientific apparatus & instruments Soft x rays X ray microscopy X ray sources
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!