Charge-separated spectra of suprathermal highly charged bismuth ions in a dual laser-produced plasma soft x-ray source
We investigated the charge-separated spectra of highly charged suprathermal bismuth (Bi) ions from a dual laser-produced plasma soft x-ray source developed for soft x-ray microscopy. The charge distribution of these suprathermal ions emitted from a solid planar Bi target was measured by an electrost...
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Veröffentlicht in: | Review of scientific instruments 2020-08, Vol.91 (8), p.086103-086103 |
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Hauptverfasser: | , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We investigated the charge-separated spectra of highly charged suprathermal bismuth (Bi) ions from a dual laser-produced plasma soft x-ray source developed for soft x-ray microscopy. The charge distribution of these suprathermal ions emitted from a solid planar Bi target was measured by an electrostatic energy analyzer. The maximum ionic charge state was observed to be Z = 17 and to possess a maximum energy of about 200 keV. This evaluation provides important information essential for the development of debris mitigation schemes in a soft x-ray microscope. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/5.0012225 |