Semimetal CaIrO3 thin films as revealed by electrical resistivity and photoemission spectroscopy

Semimetal CaIrO3 thin films as revealed by electrical resistivity and photoemission spectroscopy

We have investigated the structural, transport properties and electronic structure of CaIrO3 (CIO) thin film on (LaAlO3)0.3(Sr2AlTaO6)0.7 (100) substrate. X-ray diffraction results reveal the phase purity and the epitaxial growth of the film with partial tensile strain. The overall behavior of the t...

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Hauptverfasser: Kumar, K. Santhosh, Reddy, B. H., Dagar, Rahul, Singh, R. S., Rana, D. S.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Electrical resistivity
Electronic structure
Epitaxial growth
Photoelectric emission
Residual resistivity
Resistivity ratio
Spectrum analysis
Substrates
Temperature dependence
Tensile strain
Thin films
Transport properties
X ray photoelectron spectroscopy
X-ray diffraction
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Zusammenfassung:We have investigated the structural, transport properties and electronic structure of CaIrO3 (CIO) thin film on (LaAlO3)0.3(Sr2AlTaO6)0.7 (100) substrate. X-ray diffraction results reveal the phase purity and the epitaxial growth of the film with partial tensile strain. The overall behavior of the temperature dependent electrical resistivity is insulating like whereas residual resistivity ratio indicates that the semi-metallic like transport in the CIO thin film. The semi-metallic nature was further confirmed by x-ray photoemission spectroscopy (XPS) from the observation of screening mechanism present in Ir 4f state and finite density of states at the Fermi level.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.5113217