On the way to enhance the optical absorption of a-Si in NIR by embedding Mg2Si thin film

Mg2Si thin film was embedded in amorphous silicon matrix by solid phase epitaxy. The structure and optical properties were investigated by electron energy loss, X-ray photoelectron, Raman, and photo thermal deflection spectroscopy measurements. It was found that in the photon energy range of 0.8–1.7...

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Veröffentlicht in:	Applied physics letters 2016-07, Vol.109 (4)
Hauptverfasser:	Chernev, I. M., Shevlyagin, A. V., Galkin, K. N., Stuchlik, J., Remes, Z., Fajgar, R., Galkin, N. G.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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