Detection of Cs 2 Ge + clusters for the quantification of germanium atomsby secondary ion mass spectrometry: Application to the characterizationof Si 1 − x Ge x layers ( 0 ⩽ x ⩽ 1 ) and germanium diffusion in silicon

We have studied the matrix effects in Si 1 − x Ge x structures under O 2 + and Cs + bombardments. Matrix effects are practically suppressed with Cs 2 Ge + secondary ions, for Ge concentrations between 0 and 100 at. % . A procedure for the accurate quantification of the Ge concentration in Si 1 − x Ge x alloys using Cs 2 Ge + and Cs Ge + clusters has been proposed. For structures in which the Ge content is constant over several hundreds of nanometers, both methods provide very similar results, with an excellent agreement between the Ge concentrations measured by secondary ions mass spectrometry and x-ray diffraction. However, for continuously varying Ge concentration profiles, the nonlinear response of the Cs Ge + normalized intensity and the persistence of strong matrix effects for Cs Si + ions lead to differences between the Ge concentration profiles measured with the Cs Ge + method compared to the Cs 2 Ge + one. The latter is therefore the only reliable method for the study of Ge indiffusion into Si from a pure Ge layer grown by chemical vapor deposition. An application of this method to the analysis of Ge indiffusion in Si at 900 ° C is also reported.