Resolution of Semiconductor Detectors for Fission Fragments

Resolution of Semiconductor Detectors for Fission Fragments

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Rev. Sci. Instr 1965-09, Vol.36 (9), p.1385-1386
Hauptverfasser: Haines, Eldon L., Whitehead, A. Bruce
Format: Artikel
Sprache:eng
Schlagworte:
ATOMS
COLLISIONS
EQUATIONS
FISSION PRODUCTS
INSTRUMENTATION
IONIZATION
NUMERICALS
Radiation Detection
RADIATION DETECTORS
SEMICONDUCTORS
SENSITIVITY
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 1386
container_issue 9
container_start_page 1385
container_title Rev. Sci. Instr
container_volume 36
creator Haines, Eldon L.
Whitehead, A. Bruce
description
doi_str_mv 10.1063/1.1719921
format Article
fullrecord <record><control><sourceid>scitation_cross</sourceid><recordid>TN_cdi_scitation_primary_10_1063_1_1719921</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>rsi</sourcerecordid><originalsourceid>FETCH-LOGICAL-c326t-be43a53d5b65c3363843f79cb12284b797e135baa89f3a590f252176b73e48913</originalsourceid><addsrcrecordid>eNp90MtKAzEUBuAgCtbqwjcY3ClMzcmZ3HAl1apQELysQ2aa6Eg7KclU8O3N0KILwWySwMfPfw4hp0AnQAVewgQkaM1gj4yAKl1KwXCfjCjFqhSyUofkKKUPmg8HGJGrJ5fCctO3oSuCL57dqm1Ct9g0fYjFjevd8EiFz79Zm9LAZtG-rVzXp2Ny4O0yuZPdPSavs9uX6X05f7x7mF7PywaZ6MvaVWg5LngteIMoUFXopW5qYExVtdTSAfLaWqV9hpp6xhlIUUt0ldKAY3K2zQ2pb01q2tzqPbfscjlTcYUIMqPzLWpiSCk6b9axXdn4ZYCaYTUGzG412V5s7ZBlh9l_8GeIv9CsF_4__Df5G5xscJQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Resolution of Semiconductor Detectors for Fission Fragments</title><source>AIP Digital Archive</source><creator>Haines, Eldon L. ; Whitehead, A. Bruce</creator><creatorcontrib>Haines, Eldon L. ; Whitehead, A. Bruce ; California Inst. of Tech., Pasadena</creatorcontrib><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1719921</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><subject>ATOMS ; COLLISIONS ; EQUATIONS ; FISSION PRODUCTS ; INSTRUMENTATION ; IONIZATION ; NUMERICALS ; Radiation Detection ; RADIATION DETECTORS ; SEMICONDUCTORS ; SENSITIVITY</subject><ispartof>Rev. Sci. Instr, 1965-09, Vol.36 (9), p.1385-1386</ispartof><rights>The American Institute of Physics</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c326t-be43a53d5b65c3363843f79cb12284b797e135baa89f3a590f252176b73e48913</citedby><cites>FETCH-LOGICAL-c326t-be43a53d5b65c3363843f79cb12284b797e135baa89f3a590f252176b73e48913</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://pubs.aip.org/rsi/article-lookup/doi/10.1063/1.1719921$$EHTML$$P50$$Gscitation$$H</linktohtml><link.rule.ids>314,777,781,882,1554,27905,27906,76139</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/4583317$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Haines, Eldon L.</creatorcontrib><creatorcontrib>Whitehead, A. Bruce</creatorcontrib><creatorcontrib>California Inst. of Tech., Pasadena</creatorcontrib><title>Resolution of Semiconductor Detectors for Fission Fragments</title><title>Rev. Sci. Instr</title><subject>ATOMS</subject><subject>COLLISIONS</subject><subject>EQUATIONS</subject><subject>FISSION PRODUCTS</subject><subject>INSTRUMENTATION</subject><subject>IONIZATION</subject><subject>NUMERICALS</subject><subject>Radiation Detection</subject><subject>RADIATION DETECTORS</subject><subject>SEMICONDUCTORS</subject><subject>SENSITIVITY</subject><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1965</creationdate><recordtype>article</recordtype><recordid>eNp90MtKAzEUBuAgCtbqwjcY3ClMzcmZ3HAl1apQELysQ2aa6Eg7KclU8O3N0KILwWySwMfPfw4hp0AnQAVewgQkaM1gj4yAKl1KwXCfjCjFqhSyUofkKKUPmg8HGJGrJ5fCctO3oSuCL57dqm1Ct9g0fYjFjevd8EiFz79Zm9LAZtG-rVzXp2Ny4O0yuZPdPSavs9uX6X05f7x7mF7PywaZ6MvaVWg5LngteIMoUFXopW5qYExVtdTSAfLaWqV9hpp6xhlIUUt0ldKAY3K2zQ2pb01q2tzqPbfscjlTcYUIMqPzLWpiSCk6b9axXdn4ZYCaYTUGzG412V5s7ZBlh9l_8GeIv9CsF_4__Df5G5xscJQ</recordid><startdate>196509</startdate><enddate>196509</enddate><creator>Haines, Eldon L.</creator><creator>Whitehead, A. Bruce</creator><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>196509</creationdate><title>Resolution of Semiconductor Detectors for Fission Fragments</title><author>Haines, Eldon L. ; Whitehead, A. Bruce</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c326t-be43a53d5b65c3363843f79cb12284b797e135baa89f3a590f252176b73e48913</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1965</creationdate><topic>ATOMS</topic><topic>COLLISIONS</topic><topic>EQUATIONS</topic><topic>FISSION PRODUCTS</topic><topic>INSTRUMENTATION</topic><topic>IONIZATION</topic><topic>NUMERICALS</topic><topic>Radiation Detection</topic><topic>RADIATION DETECTORS</topic><topic>SEMICONDUCTORS</topic><topic>SENSITIVITY</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Haines, Eldon L.</creatorcontrib><creatorcontrib>Whitehead, A. Bruce</creatorcontrib><creatorcontrib>California Inst. of Tech., Pasadena</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Rev. Sci. Instr</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Haines, Eldon L.</au><au>Whitehead, A. Bruce</au><aucorp>California Inst. of Tech., Pasadena</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Resolution of Semiconductor Detectors for Fission Fragments</atitle><jtitle>Rev. Sci. Instr</jtitle><date>1965-09</date><risdate>1965</risdate><volume>36</volume><issue>9</issue><spage>1385</spage><epage>1386</epage><pages>1385-1386</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><doi>10.1063/1.1719921</doi><tpages>2</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0034-6748
ispartof Rev. Sci. Instr, 1965-09, Vol.36 (9), p.1385-1386
issn 0034-6748
1089-7623
language eng
recordid cdi_scitation_primary_10_1063_1_1719921
source AIP Digital Archive
subjects ATOMS
COLLISIONS
EQUATIONS
FISSION PRODUCTS
INSTRUMENTATION
IONIZATION
NUMERICALS
Radiation Detection
RADIATION DETECTORS
SEMICONDUCTORS
SENSITIVITY
title Resolution of Semiconductor Detectors for Fission Fragments
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-18T02%3A38%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-scitation_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Resolution%20of%20Semiconductor%20Detectors%20for%20Fission%20Fragments&rft.jtitle=Rev.%20Sci.%20Instr&rft.au=Haines,%20Eldon%20L.&rft.aucorp=California%20Inst.%20of%20Tech.,%20Pasadena&rft.date=1965-09&rft.volume=36&rft.issue=9&rft.spage=1385&rft.epage=1386&rft.pages=1385-1386&rft.issn=0034-6748&rft.eissn=1089-7623&rft.coden=RSINAK&rft_id=info:doi/10.1063/1.1719921&rft_dat=%3Cscitation_cross%3Ersi%3C/scitation_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true