Continuous Ion Source for a Time‐of‐Flight Mass Spectrometer

With simple modifications improved performance of continuous ion sources in a time of flight mass spectrometer has been obtained. The system was developed for use with heated filament surface ionization sources; however, the advantages of its use with an electron bombardment source seem more signifi...

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Bibliographische Detailangaben

Veröffentlicht in:	Rev. Sci. Instr 1963-12, Vol.34 (12), p.1367-1370
1. Verfasser:	Studier, Martin H.
Format:	Artikel
Sprache:	eng
Schlagworte:	ELECTRON BEAMS HEATING INSTRUMENTATION ION SOURCES IONIZATION MASS SPECTROMETERS NOISE OPERATION PARTICLE SOURCES PULSES SENSITIVITY SIGNALS SURFACES TIME OF FLIGHT METHOD VELOCITY
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