Continuous Ion Source for a Time‐of‐Flight Mass Spectrometer

Continuous Ion Source for a Time‐of‐Flight Mass Spectrometer

With simple modifications improved performance of continuous ion sources in a time of flight mass spectrometer has been obtained. The system was developed for use with heated filament surface ionization sources; however, the advantages of its use with an electron bombardment source seem more signifi...

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Veröffentlicht in:Rev. Sci. Instr 1963-12, Vol.34 (12), p.1367-1370
1. Verfasser: Studier, Martin H.
Format: Artikel
Sprache:eng
Schlagworte:
ELECTRON BEAMS
HEATING
INSTRUMENTATION
ION SOURCES
IONIZATION
MASS SPECTROMETERS
NOISE
OPERATION
PARTICLE SOURCES
PULSES
SENSITIVITY
SIGNALS
SURFACES
TIME OF FLIGHT METHOD
VELOCITY
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Beschreibung
Zusammenfassung:With simple modifications improved performance of continuous ion sources in a time of flight mass spectrometer has been obtained. The system was developed for use with heated filament surface ionization sources; however, the advantages of its use with an electron bombardment source seem more significant. With an electron gun operating continuously, a factor of 300 increase in sensitivity over that of the pulsed mode of operation is attained with improved resolution and no increase in the ratio of noise to signal.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1718238