Continuous Ion Source for a Time‐of‐Flight Mass Spectrometer
With simple modifications improved performance of continuous ion sources in a time of flight mass spectrometer has been obtained. The system was developed for use with heated filament surface ionization sources; however, the advantages of its use with an electron bombardment source seem more signifi...
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| Veröffentlicht in: | Rev. Sci. Instr 1963-12, Vol.34 (12), p.1367-1370 |
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| container_end_page | 1370 |
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| container_issue | 12 |
| container_start_page | 1367 |
| container_title | Rev. Sci. Instr |
| container_volume | 34 |
| creator | Studier, Martin H. |
| description | With simple modifications improved performance of continuous ion sources in a time of flight mass spectrometer has been obtained. The system was developed for use with heated filament surface ionization sources; however, the advantages of its use with an electron bombardment source seem more significant. With an electron gun operating continuously, a factor of 300 increase in sensitivity over that of the pulsed mode of operation is attained with improved resolution and no increase in the ratio of noise to signal. |
| doi_str_mv | 10.1063/1.1718238 |
| format | Article |
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The system was developed for use with heated filament surface ionization sources; however, the advantages of its use with an electron bombardment source seem more significant. With an electron gun operating continuously, a factor of 300 increase in sensitivity over that of the pulsed mode of operation is attained with improved resolution and no increase in the ratio of noise to signal.</description><identifier>ISSN: 0034-6748</identifier><identifier>EISSN: 1089-7623</identifier><identifier>DOI: 10.1063/1.1718238</identifier><identifier>CODEN: RSINAK</identifier><language>eng</language><subject>ELECTRON BEAMS ; HEATING ; INSTRUMENTATION ; ION SOURCES ; IONIZATION ; MASS SPECTROMETERS ; NOISE ; OPERATION ; PARTICLE SOURCES ; PULSES ; SENSITIVITY ; SIGNALS ; SURFACES ; TIME OF FLIGHT METHOD ; VELOCITY</subject><ispartof>Rev. Sci. 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Sci. Instr</title><description>With simple modifications improved performance of continuous ion sources in a time of flight mass spectrometer has been obtained. The system was developed for use with heated filament surface ionization sources; however, the advantages of its use with an electron bombardment source seem more significant. With an electron gun operating continuously, a factor of 300 increase in sensitivity over that of the pulsed mode of operation is attained with improved resolution and no increase in the ratio of noise to signal.</description><subject>ELECTRON BEAMS</subject><subject>HEATING</subject><subject>INSTRUMENTATION</subject><subject>ION SOURCES</subject><subject>IONIZATION</subject><subject>MASS SPECTROMETERS</subject><subject>NOISE</subject><subject>OPERATION</subject><subject>PARTICLE SOURCES</subject><subject>PULSES</subject><subject>SENSITIVITY</subject><subject>SIGNALS</subject><subject>SURFACES</subject><subject>TIME OF FLIGHT METHOD</subject><subject>VELOCITY</subject><issn>0034-6748</issn><issn>1089-7623</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1963</creationdate><recordtype>article</recordtype><recordid>eNqd0M1KAzEQB_AgCtbqwTcI3hS2Tj42SW9KsVqoeGg9h20-bKTdlCQVvPkIPqNP4pYWvDsDM5cfw_BH6JLAgIBgt2RAJFGUqSPUI6CGlRSUHaMeAOOVkFydorOc36GrmpAeuhvFtoR2G7cZT2KLZ3GbjMM-JtzgeVi7n6_v6LsxXoW3ZcHPTc54tnGmpLh2xaVzdOKbVXYXh91Hr-OH-eipmr48Tkb308owKkrlDbNAnXHecao4ayzwRe25lJQToThwRXk9BCOZ4AqYXUjBh9aLhenaWtZHV_u7MZegswnFmaWJbdu9ojlhtYK6Q9d7ZFLMOTmvNymsm_SpCehdPproQz6dvdnb3a2mhNj-D3_E9Af1xnr2C-jQdGc</recordid><startdate>196312</startdate><enddate>196312</enddate><creator>Studier, Martin H.</creator><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>196312</creationdate><title>Continuous Ion Source for a Time‐of‐Flight Mass Spectrometer</title><author>Studier, Martin H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c326t-fc3d02ecefe42843ad04b5f47724168404824590c7364803db7649df6bcbcbdd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1963</creationdate><topic>ELECTRON BEAMS</topic><topic>HEATING</topic><topic>INSTRUMENTATION</topic><topic>ION SOURCES</topic><topic>IONIZATION</topic><topic>MASS SPECTROMETERS</topic><topic>NOISE</topic><topic>OPERATION</topic><topic>PARTICLE SOURCES</topic><topic>PULSES</topic><topic>SENSITIVITY</topic><topic>SIGNALS</topic><topic>SURFACES</topic><topic>TIME OF FLIGHT METHOD</topic><topic>VELOCITY</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Studier, Martin H.</creatorcontrib><creatorcontrib>Argonne National Lab., Ill</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>Rev. Sci. Instr</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Studier, Martin H.</au><aucorp>Argonne National Lab., Ill</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Continuous Ion Source for a Time‐of‐Flight Mass Spectrometer</atitle><jtitle>Rev. Sci. Instr</jtitle><date>1963-12</date><risdate>1963</risdate><volume>34</volume><issue>12</issue><spage>1367</spage><epage>1370</epage><pages>1367-1370</pages><issn>0034-6748</issn><eissn>1089-7623</eissn><coden>RSINAK</coden><abstract>With simple modifications improved performance of continuous ion sources in a time of flight mass spectrometer has been obtained. The system was developed for use with heated filament surface ionization sources; however, the advantages of its use with an electron bombardment source seem more significant. With an electron gun operating continuously, a factor of 300 increase in sensitivity over that of the pulsed mode of operation is attained with improved resolution and no increase in the ratio of noise to signal.</abstract><doi>10.1063/1.1718238</doi><tpages>4</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0034-6748 |
| ispartof | Rev. Sci. Instr, 1963-12, Vol.34 (12), p.1367-1370 |
| issn | 0034-6748 1089-7623 |
| language | eng |
| recordid | cdi_scitation_primary_10_1063_1_1718238 |
| source | AIP Digital Archive |
| subjects | ELECTRON BEAMS HEATING INSTRUMENTATION ION SOURCES IONIZATION MASS SPECTROMETERS NOISE OPERATION PARTICLE SOURCES PULSES SENSITIVITY SIGNALS SURFACES TIME OF FLIGHT METHOD VELOCITY |
| title | Continuous Ion Source for a Time‐of‐Flight Mass Spectrometer |
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