A technique for verifying the alignment of large single crystals
A procedure is presented for verifying the alignment of a crystal surface with respect to the x‐ray beam in the back‐reflection Laue technique. The procedure involves the use of a NaCl reference crystal attached to the surface of interest. Application to the determination of the orientation of a ske...
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Veröffentlicht in: | Review of scientific instruments 1974-08, Vol.45 (8), p.1032-1033 |
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Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | A procedure is presented for verifying the alignment of a crystal surface with respect to the x‐ray beam in the back‐reflection Laue technique. The procedure involves the use of a NaCl reference crystal attached to the surface of interest. Application to the determination of the orientation of a skew surface is discussed. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/1.1686801 |