A High‐Angle Tilting Stage for the 650 kV Hitachi Electron Microscope

A High‐Angle Tilting Stage for the 650 kV Hitachi Electron Microscope

A new tilting stage has been developed for the Hitachi 650 kV electron microscope. The design allows specimen tilting of ± 30° in any direction and can be inserted with no modifications to the microscope.

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Review of scientific instruments 1973-04, Vol.44 (4), p.511-512
Hauptverfasser: Bouchard, M., Worthington, W. L., Jurica, D. J., Swann, P. R.
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A new tilting stage has been developed for the Hitachi 650 kV electron microscope. The design allows specimen tilting of ± 30° in any direction and can be inserted with no modifications to the microscope.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1686169