Low Temperature Optical‐EPR Sample Probe Using Tunable Coaxial Coupling

Low Temperature Optical‐EPR Sample Probe Using Tunable Coaxial Coupling

An optical‐EPR sample probe using tunable coaxial coupling, for use at fixed temperatures in the range 1–300 K, has been designed and constructed. It allows both critical coupling of the resonant cavity to the microwave system and good sample illumination, while minimizing thermal agitation.

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Veröffentlicht in:Review of scientific instruments 1969-02, Vol.40 (2), p.268-270
Hauptverfasser: Ensign, T. C., Chang, Te‐Tse
Format: Artikel
Sprache:eng
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Zusammenfassung:An optical‐EPR sample probe using tunable coaxial coupling, for use at fixed temperatures in the range 1–300 K, has been designed and constructed. It allows both critical coupling of the resonant cavity to the microwave system and good sample illumination, while minimizing thermal agitation.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1683917