Nondestructive analysis of ultrashallow junctions using thermal wave technology
It is shown that the thermal wave (TW) nondestructive technology widely used in semiconductor industry for ion-implant monitoring can also be used for characterization of ultrashallow junctions created as a result of thermal annealing of ion implanted wafers. A set of Si wafers implanted with boron...
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Veröffentlicht in: | Review of Scientific Instruments 2003-01, Vol.74 (1), p.586-588 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | It is shown that the thermal wave (TW) nondestructive technology widely used in semiconductor industry for ion-implant monitoring can also be used for characterization of ultrashallow junctions created as a result of thermal annealing of ion implanted wafers. A set of Si wafers implanted with boron at energies 0.2–0.5 keV and implantation doses in the range of
10
14
–10
15
cm
−2
thermally annealed at different temperatures (950–1100 °C) has been studied. For all samples, the TW signal is found to vary linearly with junction depth and is shown to exhibit a very good correlation with secondary ion mass spectrometry data. A special processing of experimental data using both the TW quadrature and in-phase signal components allowing for resolution of effects introduced by different implantation doses, energies, and annealing temperatures is discussed. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/1.1515890 |