Compact electron-beam ion trap using NdFeB permanent magnets

A compact electron-beam ion trap (EBIT) as a multiply charged ion source for medium Z, e.g., Ne 10+ , Ar 18+ , Kr 26+ , and so on, has been developed. A pair of NdFeB permanent magnets generates an intense magnetic field (0.64 T) along with the electron-beam axis. The maximum electron-beam energy and current were designed as 10 keV and 30 mA, respectively. Over 95% of the electron beam up to 20 mA was transmitted to an electron collector. All parts, including electrical feedthroughs, are mounted on a con-flat flange with an 8 in. diam. Portability is added to the EBIT because no cooling system for the electromagnet is needed. Hydrogen-like Ar 17+ were extracted.