A 360° -tilt specimen holder for electron tomography in an ultrahigh-voltage electron microscope
A 360° -tilt specimen holder was designed for electron tomography in an ultrahigh-voltage electron microscope. The new holder is of simple noneucentric and single-axis tilting type, with a minimum tilt step of 0.01°. It is applicable to different types of specimens with clamping arrangement. Experim...
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| Veröffentlicht in: | Review of scientific instruments 1998-11, Vol.69 (11), p.4008-4009 |
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| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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| Zusammenfassung: | A
360°
-tilt specimen holder was designed for electron tomography in an ultrahigh-voltage electron microscope. The new holder is of simple noneucentric and single-axis tilting type, with a minimum tilt step of
0.01°.
It is applicable to different types of specimens with clamping arrangement. Experiments show that images can be observed around the maximum tilt range of
±85°.
The direction of the tilt axis is determined from the
0°
- and
180°
-tilt images. The possibility of correcting image alteration due to different specimen height is also discussed. |
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| ISSN: | 0034-6748 1089-7623 |
| DOI: | 10.1063/1.1149214 |