High-resolution electron time-of-flight apparatus for the soft x-ray region
A gas-phase time-of-flight (TOF) apparatus, capable of supporting as many as six electron-TOF analyzers viewing the same interaction region, has been developed to measure energy- and angle-resolved electrons with kinetic energies up to 5 keV. Each analyzer includes a newly designed lens system that...
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Veröffentlicht in: | Review of Scientific Instruments 1998-11, Vol.69 (11), p.3809-3817 |
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Sprache: | eng |
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Zusammenfassung: | A gas-phase time-of-flight (TOF) apparatus, capable of supporting as many as six electron-TOF analyzers viewing the same interaction region, has been developed to measure energy- and angle-resolved electrons with kinetic energies up to 5 keV. Each analyzer includes a newly designed lens system that can retard electrons to about 2% of their initial kinetic energy without significant loss of transmission; the analyzers can thus achieve a resolving power
(E/ΔE)
greater than
10
4
over a wide kinetic-energy range. Such high resolving power is comparable to the photon energy resolution of state-of-the-art synchrotron–radiation beamlines in the soft x-ray range, opening the TOF technique to numerous high-resolution applications. In addition, the angular placement of the analyzers, by design, permits detailed studies of nondipolar angular distribution effects in gas-phase photoemission. |
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ISSN: | 0034-6748 1089-7623 |
DOI: | 10.1063/1.1149183 |