High‐resolution multielement solid‐state detectors (invited)

Recent advances in multielement solid‐state detector systems for high rate, high resolution x‐ray spectroscopy at noncryogenic temperatures will be described in this paper. A 16‐channel silicon detector system, designed and built at BNL, has been recently operated in the NSLS machine beam ♯X19A, sho...

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Veröffentlicht in:Review of Scientific Instruments 1996-09, Vol.67 (9), p.3360-3360
Hauptverfasser: Pullia, Alberto, Furenlid, L., Kraner, H.W., Pietraski, P.J., Siddons, D.P.
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Sprache:eng
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Zusammenfassung:Recent advances in multielement solid‐state detector systems for high rate, high resolution x‐ray spectroscopy at noncryogenic temperatures will be described in this paper. A 16‐channel silicon detector system, designed and built at BNL, has been recently operated in the NSLS machine beam ♯X19A, showing an average energy resolution of less than 250 eV FWHM, which is adequate to discriminate the fluorescence trace element against the background of elastically scattered photons in a typical EXAFS application. A larger, 128 channel system, will soon permit a higher overall count rate: ≳106 counts per second. It is shown that, in order to achieve high resolution with a solid‐state detector, special care must be spent in the detector‐preamplifier assembly. A low noise detectorpreamplifier may be obtained integrating the front‐end devices (an FET and/or a feedback capacitor) with the detector itself.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1147390