Photon stimulated ion desorption studies using pulsed synchrotron radiation

Photon stimulated ion desorption studies using pulsed synchrotron radiation

Photon stimulated ion desorption from small molecules on Si(100) surfaces and from polymer thin films was studied using time‐of‐flight (TOF) mass spectrometric techniques. The design and operation of a TOF mass spectrometer during single bunch operation of the Photon Factory 2.5 GeV storage ring is...

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Veröffentlicht in:Review of Scientific Instruments 1995-02, Vol.66 (2), p.1474-1476
Hauptverfasser: Tanaka, K., Tinone, M. C. K., Ikeura, H., Sekiguchi, T., Sekitani, T.
Format: Artikel
Sprache:eng
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Zusammenfassung:Photon stimulated ion desorption from small molecules on Si(100) surfaces and from polymer thin films was studied using time‐of‐flight (TOF) mass spectrometric techniques. The design and operation of a TOF mass spectrometer during single bunch operation of the Photon Factory 2.5 GeV storage ring is described. Experimental results for H2O/Si(100), DCOOD/Si(100), polymethylmethacrylate and polymethylacrylate thin films are demonstrated as examples of the capabilities of the apparatus.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1145945