Bragg transmission phase plates for the production of circularly polarized x rays

The x‐ray optics for a thin‐crystal Si (400) Bragg transmission phase plate have been constructed for the production of 5 to 12 keV circularly polarized x rays. Using multiple beam diffraction from a GaAs crystal, a direct measurement of the degree of circular polarization as a function of off‐Bragg...

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Veröffentlicht in:	Review of Scientific Instruments 1995-02, Vol.66 (2), p.1540-1542
Hauptverfasser:	Lang, J. C., Srajer, George
Format:	Artikel
Sprache:	eng
Schlagworte:	440100 > Radiation Instrumentation ARSENIC COMPOUNDS ARSENIDES BRAGG REFLECTION CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ELEMENTS ENERGY RANGE GALLIUM ARSENIDES GALLIUM COMPOUNDS INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY KEV RANGE KEV RANGE 01-10 PHASE SHIFT PNICTIDES POLARIZATION RADIATION SOURCES REFLECTION SEMIMETALS SILICON X-RAY EQUIPMENT 661300 > Other Aspects of Physical Science-- (1992-) X-RAY SOURCES
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Zusammenfassung:	The x‐ray optics for a thin‐crystal Si (400) Bragg transmission phase plate have been constructed for the production of 5 to 12 keV circularly polarized x rays. Using multiple beam diffraction from a GaAs crystal, a direct measurement of the degree of circular polarization as a function of off‐Bragg position was made. These measurements indicated nearly complete circular polarization (‖P c ‖≥0.95) and full helicity reversal on opposite sides of the rocking curve.
ISSN:	0034-6748 1089-7623
DOI:	10.1063/1.1145902