Non-resonant Permittivity Measurement Methods
Abstract The measurement of the dielectric properties of materials has been applied in non-destructive tests, humidity measurement, soil analysis and even cancer detection. The methods have been developed for over 70 years based on the interaction of the electromagnetic waves with the material under...
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| Veröffentlicht in: | Journal of Microwaves, Optoelectronics and Electromagnetic Applications Optoelectronics and Electromagnetic Applications, 2017-03, Vol.16 (1), p.297-311 |
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| container_title | Journal of Microwaves, Optoelectronics and Electromagnetic Applications |
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| creator | Severo, Sergio L. S. Salles, Álvaro A. A. de Nervis, Bruno Zanini, Braian K. |
| description | Abstract The measurement of the dielectric properties of materials has been applied in non-destructive tests, humidity measurement, soil analysis and even cancer detection. The methods have been developed for over 70 years based on the interaction of the electromagnetic waves with the material under test. This work presents a general model of scattering parameters for non-resonant methods of transmission/reflection and single-port reflection. Equations for determining permittivity are obtained. New equations for short-circuited load and coupled load in the double reflection method are presented. |
| doi_str_mv | 10.1590/2179-10742017v16i1890 |
| format | Article |
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New equations for short-circuited load and coupled load in the double reflection method are presented.</description><identifier>ISSN: 2179-1074</identifier><identifier>EISSN: 2179-1074</identifier><identifier>DOI: 10.1590/2179-10742017v16i1890</identifier><language>eng</language><publisher>Sociedade Brasileira de Microondas e Optoeletrônica e Sociedade Brasileira de Eletromagnetismo</publisher><subject>ENGINEERING, ELECTRICAL & ELECTRONIC ; Microwave measurements ; OPTICS ; permittivity ; short-circuit transmission line method ; transmission/reflection method</subject><ispartof>Journal of Microwaves, Optoelectronics and Electromagnetic Applications, 2017-03, Vol.16 (1), p.297-311</ispartof><rights>This work is licensed under a Creative Commons Attribution 4.0 International License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3200-cd64988dcc20492e51b83f83e2fc49da016441865c17ccf668fd2728e33399cf3</citedby><cites>FETCH-LOGICAL-c3200-cd64988dcc20492e51b83f83e2fc49da016441865c17ccf668fd2728e33399cf3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,864,885,27924,27925</link.rule.ids></links><search><creatorcontrib>Severo, Sergio L. 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New equations for short-circuited load and coupled load in the double reflection method are presented.</description><subject>ENGINEERING, ELECTRICAL & ELECTRONIC</subject><subject>Microwave measurements</subject><subject>OPTICS</subject><subject>permittivity</subject><subject>short-circuit transmission line method</subject><subject>transmission/reflection method</subject><issn>2179-1074</issn><issn>2179-1074</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>DOA</sourceid><recordid>eNpVkN1KAzEQhYMoWGofQegLbM3kP5dS_Cm0KqjXIZtNNKXdSLIt9O3dWlt0bmY4wzkcPoSuAU-Aa3xDQOoKsGQEg9yCiKA0PkODk37-575Eo1KWuB_NAHM-QNVTaqvsS2pt241ffF7Hrovb2O3GC2_LJvu17x8L332mplyhi2BXxY9-9xC939-9TR-r-fPDbHo7rxwlGFeuEUwr1ThHMNPEc6gVDYp6EhzTjcUgGAMluAPpXBBChYZIojylVGsX6BDNDrlNskvzlePa5p1JNpofIeUPY3MX3cobySWlwOuaqMBsIzUTNethBEo4lUz0WZNDVnHRr5JZpk1u-_LmdY_FHNH1TABjomVv4AeDy6mU7MOpAGCzZ27-GY_M6Tc8sm-2</recordid><startdate>201703</startdate><enddate>201703</enddate><creator>Severo, Sergio L. 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A. de ; Nervis, Bruno ; Zanini, Braian K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3200-cd64988dcc20492e51b83f83e2fc49da016441865c17ccf668fd2728e33399cf3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>ENGINEERING, ELECTRICAL & ELECTRONIC</topic><topic>Microwave measurements</topic><topic>OPTICS</topic><topic>permittivity</topic><topic>short-circuit transmission line method</topic><topic>transmission/reflection method</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Severo, Sergio L. S.</creatorcontrib><creatorcontrib>Salles, Álvaro A. 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| subjects | ENGINEERING, ELECTRICAL & ELECTRONIC Microwave measurements OPTICS permittivity short-circuit transmission line method transmission/reflection method |
| title | Non-resonant Permittivity Measurement Methods |
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