Non-resonant Permittivity Measurement Methods

Abstract The measurement of the dielectric properties of materials has been applied in non-destructive tests, humidity measurement, soil analysis and even cancer detection. The methods have been developed for over 70 years based on the interaction of the electromagnetic waves with the material under...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of Microwaves, Optoelectronics and Electromagnetic Applications Optoelectronics and Electromagnetic Applications, 2017-03, Vol.16 (1), p.297-311
Hauptverfasser: Severo, Sergio L. S., Salles, Álvaro A. A. de, Nervis, Bruno, Zanini, Braian K.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Abstract The measurement of the dielectric properties of materials has been applied in non-destructive tests, humidity measurement, soil analysis and even cancer detection. The methods have been developed for over 70 years based on the interaction of the electromagnetic waves with the material under test. This work presents a general model of scattering parameters for non-resonant methods of transmission/reflection and single-port reflection. Equations for determining permittivity are obtained. New equations for short-circuited load and coupled load in the double reflection method are presented.
ISSN:2179-1074
2179-1074
DOI:10.1590/2179-10742017v16i1890